EDN - Events

EDN - Events The internet Home of Electronic News, EDN, Electronic Business en-us http://www.edn.com Copyright 2009 Reed Business Information. Subject to its <A href="http://www.edn.com/index.asp?layout=siteInfo&doc_id=26250">Terms of Use</A> Sun, 08 Nov 2009 11:21:32 PST Oxford University High-Speed Noise and Grounding Short Course http://www.edn.com/event/2140465280.html?nid=3377 This is an advanced-level course for experienced digital designers who want to press their designs to the upper limits of speed and distance. It is an advanced sequel to the 2 courses High-Speed Digital Design and Advanced High-Speed Signal Propagation by Dr Howard Johnson. Oxford University High-Speed Digital Design Short Course http://www.edn.com/event/2140465277.html?nid=3377 This very popular workshop covers the important and timely issues involving high-speed digital design and signal integrity. Power & Electricity Asia 2010 http://www.edn.com/event/2140456892.html?nid=3377 Oxford University Systems Engineering - Fast Track Short Course http://www.edn.com/event/2140465281.html?nid=3377 This course provides not only insights to the overall systems-engineering process, but detailed methods and tools that support that process. The methods and tools presented are pragmatic and practical and have been used on real programmes and bids in the range of £10M to £2Bn. Oxford University Successful RF PCB Design Short Course http://www.edn.com/event/2140465286.html?nid=3377 This intensive one-day course provides a thorough introduction to the principles of RF PCB design techniques in an intuitive and practical way. CDMA and EV-DO Technology http://www.edn.com/event/2140476939.html?nid=3377 Code Division Multiple Access (CDMA) is an increasingly popular method for handling higher volumes of calls. Semiconductor Reliability http://www.edn.com/event/2140477764.html?nid=3377 Semiconductor reliability is at a crossroads. In the past, reliability meant discovering, characterizing and modeling failure mechanisms and determining their impact on the reliability of the circuit. IMI's 21st Annual Thermal Printing Conference http://www.edn.com/event/2140467370.html?nid=3377 IMI’s 21st Annual Thermal Printing Conference will provide the thermal printing industry’s most comprehensive coverage ever. Failure and Yield Analysis http://www.edn.com/event/2140476930.html?nid=3377 Failure and Yield Analysis is an increasingly difficult and complex process; engineers are required to locate defects on complex integrated circuits. Oxford University Digital Signal Processing Implementation Short Course http://www.edn.com/event/2140465284.html?nid=3377 A one-day supplement to the Digital Signal Processing course that takes the theory and translates it into practice. Oxford University Digital Signal Processing Short Course http://www.edn.com/event/2140465283.html?nid=3377 Hands-on' laboratory sessions are interspersed with the lectures to illustrate the taught material and allow you to pursue your own areas of interest in DSP. Oxford University Practical RF/Microwave Design Short Course http://www.edn.com/event/2140445336.html?nid=3377 This intensive, five day course provides acceleration through the RF design learning curve by presenting a comprehensive introduction to RF and microwave design theory, techniques and measurements. Advanced Analog IC Design course http://www.edn.com/event/2140467085.html?nid=3377 This four-day Advanced Analog IC Design will be tought by Willy Sansen and Gabor Temes at the Hong Kong University of Science and Technology, 6-9 Jan. 2010. International Approvals Roundtable http://www.edn.com/event/2140437904.html?nid=3377 TÜVRheinland is hosting a series of free International Approvals roundtable discussions in the United States and Canada about the Global Regulatory Approval of products. 10th R&D-Product Development Metrics Summit http://www.edn.com/event/2140428834.html?nid=3377 A three-day event for Senior Executives covering the metrics body of knowledge combined with a workshop to develop a set of metrics for measuring overall R&D-Product Development performance.