| ADC fabrication process |
Output logic |
M-sample/sec range |
Power-dissipation sensitivity to operating conditions |
|---|---|---|---|
| Bipolar | TTL | 10 to 100 | None |
| Bipolar | ECL | 10 to 500 | None |
| BiCMOS | TTL | 10 to 100 | None |
| BiCMOS | ECL | 10 to 500 | None |
| BiCMOS | CMOS | 10 to 100 | Medium |
| CMOS | CMOS | 10 to 75 | High |
back |
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