EDN Access — The Design Information Source of the Electronics Industry


Out in Front: August 15, 1996

IC lets you easily add BERT function

A complete bit-error-rate-test (BERT)-function IC from Dallas Semiconductor generates a variety of pseudorandom or user-defined patterns and lets you add BERT capability in telecommunications test equipment with minimal additional programming or burden on your system processor. The DS2172 targets switching equipment, multiplexers, routers, and similar equipment, and it eliminates the need for external test equipment and eases design-in of automated test.

The IC operates at clock rates from dc to 52 Mbps, and you can select pseudorandom patterns as long as 32 bits. Pseudorandom and repetitive test patterns conform to CCITT (Consultative Committee on International Telephone and Telegraph)/ITU (International Telecommunications Union) O.151, O.152, O.153, and O.161 standards. In addition, you can program the DS2172 to insert single or infrequent errors to verify system error-handling functions. Within the device, 32-bit error- and bit-count registers let you collect error-rate data, and, with the device's interrupt capability, they ease software development and debugging. The 5V CMOS IC interfaces to a processor via an 8-bit parallel port and comes in a 32-pin TQFP. Price is $5.30 (5000).

—by Bill Schweber

Dallas Semiconductor Corp, Dallas, TX. (214) 450-0448, http://www.dalsemi.com.



| EDN Access | feedback | subscribe to EDN! |
| design features | out in front | design ideas | departments | products | columnist |


Copyright © 1996 EDN Magazine. EDN is a registered trademark of Reed Properties Inc, used under license.