EDN’s 20th annual Innovation Awards Finalists
-- EDN, February 18, 2010
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&& PREVIOUS FINALIST | MAIN | NEXT FINALIST >> Category: DC and Low-Frequency Test Finalist: U2723A USB source measure unit, Agilent Technologies  On the bench or in a rack, Agilent’s U2723A USB SMU (source measure unit) helps you conquer space and time. The paperback-sized SMU supplies voltage (±20V) and current (120 mA) on three channels, and it provides accurate current measurements down to nanoamp levels. The channels could be connected in series or in parallel to achieve up to 60V/360 mA. With 15-ms rise time, it improves throughput during mass testing of semiconductor devices. The U2723A is useful in consumer electronics, semiconductor, renewable energy, aerospace and defense, and communication industries. The SMU is able to test devices such as camera modules, CMOS ICs, optical transceivers, and solar cells, and it is suitable for design validation and characterization applications on semiconductor devices. The embedded test scripts featured in the U2723A enable high test throughput through parallel outputs with short rise and fall time. The U2723A supports entry of 200 list modes for each embedded test script, with up to two embedded test scripts per channel. The U2723A’s plug-and-play feature simplifies data transfer via USB interface. It conforms to the USBTMC specification to guarantee compatibility to IEEE 488 products. The U2723A comes bundled with AMM (Agilent Measurement Manager) software, which includes a command logger function to help convert SCPI commands into snippets of VEE, VB, C++, and C# code. |
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