EDN's 19th Annual Innovation Awards Finalists
-- EDN, February 2, 2009
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&& PREVIOUS FINALIST | MAIN | NEXT FINALIST >> Category: Instruments Finalist: PNA-X nonlinear vector-network analyzer (Agilent Technologies) With the proliferation of high data rate wireless communications, engineers are being faced with the challenge of designing components and systems which provide voice, video, IP, and more in a fast, compact, power-efficient format. This requires pushing semiconductor devices to their performance limits and, increasingly, into their nonlinear regions of operation. Dealing with nonlinearity means new measurement methodologies that go far beyond linear S-parameters. Agilent’s interoperable measurement and simulation environment for designing nonlinear components is based on a mathematically correct scattering coefficient (X-parameter) for active components that can be measured and used in a simulator to simulate actual linear and nonlinear component behavior. Users can measure and extract X-parameters with Agilent’s new nonlinear vector network analyzer (NVNA), and they can create poly-harmonic distortion device models that can be imported into the Agilent Advanced Design Simulator. X-parameters, ADS, and the NVNA can be used to reconstruct time-domain waveforms and determine performance parameters such as ACPR, EVM, and PAE. |
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With the proliferation of high data rate wireless communications, engineers are being faced with the challenge of designing components and systems which provide voice, video, IP, and more in a fast, compact, power-efficient format. This requires pushing semiconductor devices to their performance limits and, increasingly, into their nonlinear regions of operation. Dealing with nonlinearity means new measurement methodologies that go far beyond linear S-parameters. Agilent’s interoperable measurement and simulation environment for designing nonlinear components is based on a mathematically correct scattering coefficient (X-parameter) for active components that can be measured and used in a simulator to simulate actual linear and nonlinear component behavior. Users can measure and extract X-parameters with Agilent’s new nonlinear vector network analyzer (NVNA), and they can create poly-harmonic distortion device models that can be imported into the Agilent Advanced Design Simulator. X-parameters, ADS, and the NVNA can be used to reconstruct time-domain waveforms and determine performance parameters such as ACPR, EVM, and PAE.






