FEI and Zyvex Sign Strategic Alliance
Online Staff -- EDN, August 4, 2004
FEI Co. and Zyvex Corp. have signed an agreement to jointly provide electrical/IC probing technology, the companies said today.
The agreement calls for the companies to share marketing, sales, and applications engineering resources to create new applications that combine Zyvex's nanomanipulation and probing technologies with FEI's expertise in analyzing nanoscale features in semiconductor devices.
Zyvex's NanoWorks provides what the company terms "nanomanipulation" and probing systems that are compatible with scanning electron microscopes (SEMs), focused ion beam systems (FIBS), confocal microscopes, probe stations, and standard upright and inverted optical microscopes. FEI, in turn, supplies FIBs and SEMS, among other tools.
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