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From EDN Europe: Make faster measurements on digital signals

By Graham Prophet -- EDN Europe, 11/8/2001

Agilent has extended the capabilities of a number of its RF-measurement instruments with new versions of spectrum analysers, network analysers, mobile-radio testers, and a new vector-signal generator. Heading the list is the PSA II spectrum analyser, which has been given new capabilities aimed at the mobile-radio-test sector (Picture). It allows you to make complex power and modulation measurements on second- and third-generation signals with only a few keystrokes. Three versions cover the frequency range to 6.7, 13.2, and 26.5 GHz; amplitude accuracy is ±0.65 dB, and measurement speed is as high as 35 measurements/sec at 1-msec sweep time. You can measure parameters, such as phase noise and power for all common digital-modulation formats, with one button press, and the instrument has an optional "personalities" to measure digital-demodulation characteristics; wideband CDMA, GSM/Enhanced Data for GSM Evolution, cdma2000, cdmaOne, and NADC/PDC can all simultaneously reside in the instrument.

For its PNA network analysers, ranging to 50 GHz, upgraded specifications include higher measurement speed, wider dynamic range, and lower trace noise. The E8364A models claims a noise floor 30 dB below that of the earlier 8722 instrument. The ENA series of RF-network analysers boasts similar gains, and the ESG vector-signal generator supports signal generation for all of the usual digital-modulation schemes and includes features for designers of wireless LANs. Rounding out this flood of announcements, Agilent has added a number of options for the 8960 series 10 wireless-test set; you can now configure the instrument to produce comprehensive signals to verify GPRS or w-CDMA system operation.

Agilent Technologies, +44 7004 666666, www.agilent.com.



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