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EDN on Test & Measurement: DSP-based instruments radically alter swept-spectrum analysis

-- EDN, 6/29/2009

EDN on Test & Measurement: Ensuring hardware and software design
  June 29, 2009

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Scope-based tools support complete debugging and compliance testing of Superspeed USB 3.0
Scope-based tools support complete debugging and compliance testing of Superspeed USB 3.0Tektronix's new DPO (digital-phosphor-oscilloscope)/DSA (digital-signal-analyzer) 70000B family is now available with a USB-TX option, which, with the press of a button, allows you to automatically and rapidly validate USB (Universal Serial Bus) 3.0 Superspeed transmitters. Read more >>

DSP-based instruments radically alter swept-spectrum analysis
DSP-based instruments radically alter swept-spectrum analysisWith the aid of new hardware and software, enhanced DSP-based real-time spectrum analyzers from Tektronix use advanced triggering technology and real-time signal analysis to deliver unique diagnostic capabilities that speed analysis in resolving performance problems in systems for spectrum management, radar, electronic warfare, and radio communications at frequencies to 14 GHz. Read more >>

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Software upgrade brings logic-analyzer-style insights to audio testing

Passive scope probes offer bandwidths to 1.5 GHz for high-speed-digital applications

Pulse/function/noise/arbitrary-waveform generator combines protocol- and physical-layer testing

Verigy accelerates yield learning on V93000 test platform

1- to 4-GHz, 20G-sample/sec DSOs and MSOs integrate protocol analysis

Synopsys releases Custom Designer 2009.06, touts RF prowess

Network analyzer for active-device test adds 13.5-, 43.5-, and 50-GHz models

Asylum outfits AFMs with thermal-analysis capabilities

Agilent, Anite demonstrate LTE streaming video

Design and test highlights at the microwave show

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Emulate and measure RFID signals with a single system
National Instruments supplies flexible software utilities and low-cost, modular RF instrumentation for the emulation and measurement of RFID readers and tags. You can combine these tools to perform comprehensive protocol and parametric tests in accordance with international RFID standards. Learn how through Webcasts, tutorials, and reference test systems.
Click Here.

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Rick's Short Circuit
Rick's Short CircuitFor "Rick's Short Circuit," EDN Editor Rick Nelson tours general-interest Web sites looking for technology news. Each day, he summarizes that news for our readers, saving them time and effort. Find "Rick's Short Circuit" in Rick's Taking the Measure blog and sample today's entry below. Read more >>

Be very afraid of cyber warfare, don't be afraid of innovation

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Connect to your test equipment directly from MATLAB® using standard communication protocols and hundreds of available instrument drivers. For more information on supported hardware, visit www.mathworks.com/connect

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Designing with LEDs e-book
EDN's Designing with LEDs workshop, held on April 30, was the first industry event to address high-brightness LED design challenges from the viewpoint of the hardware engineer. As it completely sold out, we regretfully had to turn away late registrants. But, as always, EDN has all of its readers covered. We're publishing the papers presented at the workshop in this e-book to broaden the reach of the workshop and to make the information widely available. Registration required.

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For the past 30 years, National Instruments has been a technology pioneer and leader in virtual instrumentation - a revolutionary concept that has changed the way engineers and scientists in industry, government, and academia approach measurement and automation.
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Test Sockets for BGA Device Testing
Cascade Microtech offers BGA test sockets to address demanding high-performance signal integrity requirements for high-frequency component and system-level testing. Competitively priced compression-mount test sockets accommodate a wide range of standard and custom package sizes and I/O counts. Click Here.

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