Skip navigation
Advertisement

Zibb

EDN on Test & Measurement

-- EDN, 10/26/2009

EDN on Test & Measurement: Ensuring hardware and software design
  October 26, 2009

FREE MAGAZINE SUBSCRIPTION (PRINT OR DIGITAL)

TOP STORY

EDN Innovation Awards: Call for nominations
EDN Innovation Awards: Call for nominationsEDN is now accepting nominations for the 20th annual Innovation Awards, which will take place in April 2010. Don't miss this opportunity for your company's and colleagues' accomplishments to be recognized by their industry peers. Nominate your best of the best for the Innovator of the Year award, recognizing an electronics engineer or engineering team for innovation in product design or technical leadership, and the Innovation of the Year awards, recognizing unique, state-of-the-art electronics products in several categories. Read more >>

Also, visit this page by November 4 to nominate your company for Test & Measurement World's Best in Test or Test of Time awards.

 MORE ARTICLES AND ANALYSIS

Tektronix spectrum analyzer reaches 20 GHz

Divide and conquer signal anomalies

Agilent ADS channel simulator mode determines ultralow bit-error rate in seconds

Gigatronics offers switching systems for surveillance antennas

High-performance MSOs feature 20-GHz analog bandwidth

RF-vector-signal generator combines high throughput, low phase noise

FiberVision's 5-Mpixel camera employs active PoE

MORE ARTICLES >>

ADVERTISEMENT

Introducing National Instruments X Series Data Acquisition
NI X Series features new NI-STC3 technology that provides four enhanced counters and optimization for multicore PCs. Available on PCI Express and PXI Express; X Series is designed to address the needs of the most demanding test and measurement applications. Learn more about the benefits of X Series.

READERS' CHOICE: BEST OF Q3

Most-clicked-on content in the September quarter
Most-clicked-on content in the September quarterSeptember is over and October is here, closing Q3 and bringing the final quarter of 2009 to its start. But before you get wrapped up in your end-of-year planning, review some of Q3's most-read articles and blogs from across EDN below. Topics that grabbed EDN readers' attentions last quarter included restrictions on materials, the solar industry, and the changing market for SSDs. And don't forget to share your thoughts in our blog comment and article feedback loop sections.

For more of EDN's most-clicked-on content in Q3 2009, see this issue of EDN Online.

ADVERTISEMENT

EDN Editorial Webcast: High-Level Software for Embedded-System Design
High-level software tools give experts in fields such as aerospace engineering, medical electronics, mechatronics, and more, control over the implementation of embedded systems. Such software can automatically generate code for target processors or FPGAs, leading to the possibility that dedicated hardware- and software-embedded-system designers may become members of an endangered species. Join our panel of experts as they explore collaborative solutions. Register now! Click Here.

ADVERTISEMENT

High Technology Electronic Test & Measurement Equipment
Late model high technology electronic test and measurement equipment excess to the needs of our client. Sale includes signal generators, logic analyzers, oscilloscopes, power supplies and probes from manufacturers such as Agilent, Anritsu, Tektronix, Rohde & Schwarz and Maury. Click here

FEATURED CONTENT

Does your salary measure up?
EDN sister publication Test & Measurement World recently surveyed its subscribers about their education, experience, compensation, job satisfaction, and workload. Check out the results in the 2009 Career and Salary Survey to learn how your salary and benefits compare to those of your peers.

SPONSORED
EDN's Resource Center

Featured Vendor
National Instruments

For the past 30 years, National Instruments has been a technology pioneer and leader in virtual instrumentation - a revolutionary concept that has changed the way engineers and scientists in industry, government, and academia approach measurement and automation.

• View All Resources From National Instruments
Latest Resources

ADVERTISEMENT

Exclusive Webcast: Making The Most out of Your Memory
A study of memory challenges, issues, and trends in embedded systems designs. This webcast reviews the findings of a recent research study conducted by Reed Business on memory challenges, trends and needs faced by embedded engineers. Learn about the challenges faced by engineers in today's fast-paced world of embedded design and listen as industry experts discuss types of memory and how each can provide solutions to different design challenges. Register now!
FINE PRINT



If this eNewsletter was forwarded to you, please go to our eNewsletter subscription page to sign up for your own copy.

Begin or renew your EDN magazine subscription

Send editorial questions about this eNewsletter to: Suzanne Deffree
Send advertising questions about this eNewsletter to: Judy Hayes or Laura Lang-Dacus

For additional assistance, contact us by email or at the address below:
EDN, Customer Service, 8878 Barrons Blvd, Highlands Ranch, CO 80129-2345 USA.

Copyright 2009, Reed Business Information, a division of Reed Elsevier, Inc.

Reed Business Information Resource Center

Featured Company

Most Recent Resources

ADVERTISEMENT
ADVERTISEMENT

Feedback Loop


Post a CommentPost a Comment

There are no comments posted for this article.

By This Author

There are no additional articles written by this author.


ADVERTISEMENT

Newsletters

EDN Design Ideas: Strategy processes video in RAM 3/19/2010

EDN Online: Swimming in the channel; Polyphase filters reduce saturation; more... 3/18/2010

Electronic News Today: A design team perspective on IC reverse engineering 3/12/2010

Sign UpSign Up

Knowledge Center

Events

Defect-Based Testing Course
Dates: 3/24/2010 - 3/26/2010
Location: Melaka, Malaysia

EMC 2010: SI and EMC – A Twisted Pair
Dates: 4/20/2010 - 4/20/2010
Location: Von Braun Center, Huntsville Alabama

11th R&D-Product Development Metrics Summit
Dates: 5/4/2010 - 5/6/2010
Location: Four Points Sheraton Hotel - Norwood, MA

ERTS² 2010
Dates: 5/19/2010 - 5/21/2010
Location: Toulouse, France

MEMS Technology Course
Dates: 5/31/2010 - 6/2/2010
Location: Malaysia

Submit an EventSubmit an Event

Reference Designs

54 W (200 W peak) Audio Amplifier Power Supply

Bluetooth MP3 ref design

CSR offers DSP reference design for dual-mic noise cancellation for Bluetooth headsets

Submit a DesignSubmit a Design

Press Releases

900 MHz RFID Reader offers Long Read Range up to 15m

ORing Offers Reliable Industrial USB to Serial Networking Solutions for a Wide Range of Applications

4ipnet Reveals WHG707 GbE WLAN Controller with Combo SFP Ports for Telecom-grade Provisioning

Submit a ReleaseSubmit a Release

Technology Quick Links

EDN Marketplace

About Us   |   Contact Us   |   Free Email Newsletters   |   Free Magazine Subscription  |   Advertising   |   RSSRSS   

©1997-2010 Reed Business Information, a division of Reed Elsevier Inc. All rights reserved.
Use of this Web site is subject to its Terms of Use | Privacy Policy