Profile

• About Me

Recent Posts

• Show attendance strong, focus shifts from consumer electronics to medical applications
• Halla on what the semiconductor industry is doing for you
• ITC: ATE companies team with chip makers, OSAT
• IMEC: Bringing science to life through art
• ASML and IMEC: from planar transistors to 3D microthrusters
• Body DAQ presents health, entertainment opportunities
• Salary survey results are coming, but some trends are evident now
• ITC panel to address yield learning: who pays, who gets the data
• Economy in the hands of gamblers
• Alice and friends cram for Turing test

Recent Comments

• TClose on Metric system rears ugly head in US election
• Lizhoignbiori on Credence, LTX plan merger, rationalization ahead
• Paul Trusten, R.Ph. on Metric system rears ugly head in US election
• Paul Trusten, R.Ph. on Obama would establish national CTO, supports nuclear electric technologies
• Caullyresenny on Credence, LTX plan merger, rationalization ahead

Most Commented On

• Metric system rears ugly head in US election (46)
• Stupid consumers plague CE industry (25)
• Hummer vs. hybrid (14)
• Incandescents, fluorescents, LEDs, oh my! (12)
• Does McCain owe the patent troll? (10)

Archives

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By Category

• 3G (8)
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• Aerospace & Defense (1)
• Analog ICs (1)
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• Audio Test (2)
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• Automotive, Aerospace, & Defense Test (13)
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• Cellular Technology (8)
• Communications Test (3)
• Communities (1)
• Computer Technology & Internet (28)
• Computers (1)
• Consumer Products (1)
• Coordinate Measurement Machines (1)
• Data Acquisition (2)
• Data Analysis (1)
• Design for Test/ Built-in Self-Test (8)
• Design Methodology (1)
• Design, Production Test, and Yield (1)
• Digital Audio Players (1)
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• Electronics Careers & Training (58)
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• Electronics Industry Mergers & Acquisitions (2)
• Electronics Systems (1)
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• JTAG/IEEE 1149 (1)
• LAN (1)
• LXI (1)
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• Machine-Vision Lighting (1)
• Measurement Software (3)
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• Package Test (4)
• People (18)
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• PXI (2)
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• Test & Measurement (83)
• Test and Measurement (1)
• Topical Taxonomy--Consumer Electronics Industry (1)
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• Wafer Probing (3)
• Wi-Fi (3)
• WiMax (1)
• Wireless Infrastructure (3)
• Wireless Networks (4)
• WLAN (3)
• X-Ray Inspection (1)
• Yield Analysis (2)

Test & Measurement Articles

• FPGA-based PXI modules improve test-system I/O performance
• On-chip instruments track malicious RTL
• Stick to the schematic
• DSO-based software analyzes 20-GHz-bandwidth RF signals
• EDN on Test & Measurement: High-performance scopes, DSO-based software, more...
• More...