Rick Nelson, editor in chief of Test & Measurement World and EDN, comments on test, globalization, measurement, machine vision, economics, nanotechnology, the engineering profession, and topics of general interest.
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Blog
Monday, June 15, 2009
Design and test highlights at the microwave show
Jun 15 2009 7:25AM | Permalink |Comments (0) |
I attended the IEEE MTT-S International Microwave Symposium last week, where I saw a variety of design and test products, ranging from RF-friendly EDA tools to high-volume production-test-worthy instruments. Of particular note was an emphasis on the 60-GHz ISM band for HD transmission within the home. Here are some highlights (click each link for details):
• Keithley upgrades RF vector signal analyzer, introduces upconverter.
• Design mingles with test as Agilent’s Solomon touts measurement focus.
• Noisecom, Rohde & Schwarz demo 60-GHz noise-figure measurement.
• Giga-tronics introduces fast-switching 50-GHz signal generators.
• National Instruments highlights WiMAX test.
• Anritsu debuts VNAs and power sensors.
• Tektronix addresses RF/Microwave challenges, hosts Mesuro at IMS booth.
• Aeroflex expands PXI platform with high-power signal generators.
• Boonton introduces peak power sensor.
• Nokia exec touts open innovation.
• Synopsys releases Custom Designer 2009.06, touts RF prowess.
• CST highlights simulation and solver tools.
• Crystek debuts pocket reference oscillator.
• Richardson Electronics adds test product line from W L Gore.
• Centellax previews 10-MHz to 50-GHz power amplifier.
Also, read our preshow interview with Fred Schindler, general chair of this year's IMS and director of RF Micro Devices' Boston Design Center.
Related entries in: Automotive, Aerospace, & Defense Test | Design for Test/ Built-in Self-Test | Oscilloscopes | RF Engineering | RF/Microwave/Wireless Test | RFIC | Signal Analyzers | Signal Generators | Spectrum Analyzers | Wireless Networks |
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