Intepro Systems SEMTest: Stress-screening reliability tester qualifies COTS components for high-reliability applications

The SEMTest power-semiconductor-test system performs accelerated lifetime testing of power semiconductors and modules using IGBT (insulated-gate-bipolar-transistor), MOSFET, SCR (silicon-controlled rectifier), diode and bipolar parts. You can configure the system with 20 to 1000 test cells, and larger systems available by special order. Each of the stress-screening reliability tester’s cells feature a local controller to set and monitor applied or UUT (unit-under-test) power and other test parameters. The system provides a measurement unit for temperature, current, voltage, and timing; allows complete characterization and production tests to accelerate failure mechanisms of individual devices: and determines functional operating limits. Features include power cycling for thermal and electrical stressing of devices under test, trend monitoring with user-defined warning and control limits, rapid device temperature cycling and ambient temperature profiling, detecting nascent failures, and automatically sending alerts. The system also measures junction temperatures. The SEMTest stress-screening reliability tester costs $100,000.

Intepro Systems, www.inteproate.com