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Corelis ScanExpress JET: Test tool combines boundary-scan and functional-test technologies

March 16, 2007

The ScanExpress JET (JTAG-emulation test) combines boundary-scan and functional-test technologies. The test tool combines common-pin and net-level diagnostics using boundary-scan testing with processor-emulation testing through the JTAG port. This feature provides test capabilities on designs using JTAG-compatible processors to non-JTAG-peripheral components, including analog parts in the processor-address and I/O space. This feature allows sound structural tests for opens and shorts using boundary-scan testing and the ability to perform at-speed functional testing using the processor for running test programs loaded into memory. Before loading test programs into onboard memory, the device tests the onboard memory at speed, without loading code into the memory, allowing testing and diagnosis of faulty boards and systems when the embedded processor cannot boot and the board self-test is not operating. The ScanExpress JET costs $17,000.

Corelis, www.corelis.com

Posted by EDN Staff on March 16, 2007 | Comments (2)

April 9, 2012
In response to: Corelis ScanExpress JET: Test tool combines boundary-scan and functional-test technologies
Kerim commented:

looks really good, I didnt know iosrmcoft would ban you for just changeing the case, as your not really MODDING the hardware (apart from cooling).Also it looks like you hot clued the MB mounts how comes you didnt drill them? or am I just seeing things? lol


August 27, 2007
In response to: Corelis ScanExpress JET: Test tool combines boundary-scan and functional-test technologies
name commented:

blabla

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