Subscribe to EDN

DAC-orama '07: IBM’s See-Thru Wafer

June 11, 2007

In a DAC follow-up, IBM sent me this photo of a thinned wafer with metal-filled, through-silicon vias. You can’t see those vias in this photo, but it’s a colorful shot and the wafer’s transparency gives a good sense of how thinly ground the wafer is.

Posted by Steve Leibson on June 11, 2007 | Comments (0)
POST A COMMENT
Display Name
captcha

Before submitting this form, please type the characters displayed above. Note the letters are case sensitive:

Advertisement
Advertisement
Advertisement
About EDN   |   Site Map   |   Contact Us   |   Subscription   |   RSS
© 2012 UBM Electronics. All rights reserved.
Use of this Web site is subject to its Terms of Use | Privacy Policy

Please visit these other UBM Canon sites

UBM Canon | Design News | Test & Measurement World | Packaging Digest | EDN | Qmed | Pharmalive | Appliance Magazine | Plastics Today | Powder Bulk Solids | Canon Trade Shows