Jit Lim, Tektronix senior technologist for high-speed signal analysis, has an EE degree from the Massachusetts Institute of Technology and more than 20 years of experience in the test-and-measurement industry. He has also designed some of Tektronix's highest-performance real-time scopes and published numerous technical papers. Lim brings his extensive experience in signal integrity, jitter measurement, and high-speed-signal physical-layer characterization to these blog posts.