Test & Measurement
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Oscilloscopes and ENOBJoel Woodward and Brig Asay, Agilent Technologies, March 15, 2012Selecting an oscilloscope for critical measurements requires knowledge of the quality of the scope’s measurement system. More
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IMEC offers 14-nm dev kit, test chip to follow 2H12Peter Clarke, EE Times, March 6, 2012The kit includes support for a number of technologies that are likely to be required at the 14-nm node including FinFET devices and extreme ultraviolet lithography. More
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Chronicles of Grumman's 1960s Lunar Excursion Module developmentSteve Taranovich, senior technical editor, March 1, 2012As America streched for the moon in the 1960s, a group of daring, talented men was specially chosen for the success of this heroic, pioneering effort. They were not astronauts but a team of young Grumman engineers about to embark upon an historic journey filled with technical design challenges in an extremely hostile environment. Their goal: to protect the lives of the many crews of astronauts that would be ferried to the moon and back. More
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Circuit protection basics - Part 2: Case study - understanding and using predictive analysisDavid McGirt, V.P. of Engineering, Innovolt, February 7, 2012This article discusses a circuit protection technology that guards against damage from 99.5% of power disturbances including an infinite variation of voltage sags, brown outs, over voltages, power outages and damaging current inrushes. More
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Stable pulse generator uses matched transistors in a current mirrorBill Morong, Paoli, PA; Edited by Margery Conner and Fran Granville, February 2, 2012Inexpensive dual transistors work as well as do legacy matched pairs. More
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CES is over; it's time to start designingPatrick Mannion, Director of Content, January 19, 2012DesignCon focuses on both inspiration and deep-dive exploration of the technologies and techniques designers can apply toward forging the next generation of electronic devices and systems. More
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Wireless temperature monitor has data-logging capabilitiesTom Au-Yeung and Wilson Tang, Maxim Integrated Products, Sunnyvale, CA; Edited by Paul Rako and Fran Granville, January 19, 2012You can make a wireless temps system with two ICs. More
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Make an asynchronous clock for VPX-based PCIe systemsVadim Vaynerman, Bottom Line Technologies Inc, Westminster, MD; Edited by Paul Rako and Fran Granville, January 19, 2012Careful crystal selection and an FPGA are key to success. More
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Use a photoelectric-FET optocoupler as a linear voltage-controlled potentiometerSajjad Haidar, University of British Columbia, Vancouver, BC, Canada; Edited by Paul Rako and Fran Granville, January 19, 2012The circuit takes advantage of an identical photo-FET as a feedback element. More
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Simple circuit tests twisted-pair cablesMark D Braunstein, Contel Information Systems, Fairfax, VA; Edited by Paul Rako and Fran Granville, January 19, 2012Quickly test a cable containing twisted-wire pairs and detect open or reversed pairs, shorted pairs, and shorts between unrelated pairs. More
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DesignCon memory previewJanine Love, Editor, EE Times' Memory Designline, January 9, 2012Here are some memory-related DesignCon presentation and forum highlights. More
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Measure an amplifier's THD without external filtersKen Mendez, Maxim Integrated Products, Sunnyvale, CA; Edited by Paul Rako and Fran Granville, January 5, 2012Adding a secondary amplifier boosts the THD to measurable levels. More
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Use air-core-coil resistance to estimate inductancePeter Demchenko, Vilnius, Lithuania; Edited by Paul Rako and Fran Granville, January 5, 2012If the coil is tightly wound you do not need the number of turns to calculate inductance. More
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Current monitor uses Hall sensorPaul Galluzzi, Dynamics Research Corp, Wilmington, MA; Edited by Paul Rako and Fran Granville, January 5, 2012Use a Hall-effect sensor to measure dc current in the range of 0 to 40A. More
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Our editors' favorite gadgetsStaff, December 15, 2011Our editors reflect on some of the gadgets and gizmos that they personally find most useful, most fun, or most intriguing. More
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Circuit provides more accurate multiplicationYakov Velikson, Lexington, MA; Edited by Paul Rako and Fran Granville, December 15, 2011Convert into and out of the sampled-data domain to get an accurate multiplication. More
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A few added components make a self-contained controller for 100A loadSteve Hageman, AnalogHome.com, Windsor, CA; Edited by Paul Rako and Fran Granville, December 15, 2011Add a few components and you have a stand-alone piece of test gear. More
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Simple night-light uses a photoresistor to detect duskChau Tran, Analog Devices, Malden, MA; Edited by Paul Rako and Fran Granville, December 15, 2011You can adjust this battery-powered circuit for different levels. More
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Hot technologies: Looking ahead to 2012Staff, December 12, 2011Our editors reflect on some of the hot trends and technologies in 2011—and look ahead to 2012. More
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Mobile apps: The next engineering toolMartin Rowe, Senior Technical Editor, Test & Measurement World, December 12, 2011Mobile apps show great promise as the next wave of measurement instruments, reference tools, computational tools, simulators, and system controllers. More
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