News and technical information about test & measurement equipment and strategies from the point of view of the R&D or design and development engineer. Topics include T&M hardware such as oscilloscopes and signal generators/analyzers, as well as software and test methodologies.
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Circuit protection basics - Part 2: Case study - understanding and using predictive analysis
David McGirt, V.P. of Engineering, Innovolt, February 7, 2012This article discusses a circuit protection technology that guards against damage from 99.5% of power disturbances including an infinite variation of voltage sags, brown outs, over voltages, power outages and damaging current inrushes. More -
Stable pulse generator uses matched transistors in a current mirror
Bill Morong, Paoli, PA; Edited by Margery Conner and Fran Granville, February 2, 2012Inexpensive dual transistors work as well as do legacy matched pairs. More -
CES is over; it's time to start designing
Patrick Mannion, Director of Content, January 19, 2012DesignCon focuses on both inspiration and deep-dive exploration of the technologies and techniques designers can apply toward forging the next generation of electronic devices and systems. More -
Wireless temperature monitor has data-logging capabilities
Tom Au-Yeung and Wilson Tang, Maxim Integrated Products, Sunnyvale, CA; Edited by Paul Rako and Fran Granville, January 19, 2012You can make a wireless temps system with two ICs. More -
Make an asynchronous clock for VPX-based PCIe systems
Vadim Vaynerman, Bottom Line Technologies Inc, Westminster, MD; Edited by Paul Rako and Fran Granville, January 19, 2012Careful crystal selection and an FPGA are key to success. More -
Use a photoelectric-FET optocoupler as a linear voltage-controlled potentiometer
Sajjad Haidar, University of British Columbia, Vancouver, BC, Canada; Edited by Paul Rako and Fran Granville, January 19, 2012The circuit takes advantage of an identical photo-FET as a feedback element. More -
Simple circuit tests twisted-pair cables
Mark D Braunstein, Contel Information Systems, Fairfax, VA; Edited by Paul Rako and Fran Granville, January 19, 2012Quickly test a cable containing twisted-wire pairs and detect open or reversed pairs, shorted pairs, and shorts between unrelated pairs. More -
DesignCon memory preview
Janine Love, Editor, EE Times' Memory Designline, January 9, 2012Here are some memory-related DesignCon presentation and forum highlights. More -
Measure an amplifier's THD without external filters
Ken Mendez, Maxim Integrated Products, Sunnyvale, CA; Edited by Paul Rako and Fran Granville, January 5, 2012Adding a secondary amplifier boosts the THD to measurable levels. More -
Use air-core-coil resistance to estimate inductance
Peter Demchenko, Vilnius, Lithuania; Edited by Paul Rako and Fran Granville, January 5, 2012If the coil is tightly wound you do not need the number of turns to calculate inductance. More
TECHNOLOGY QUICK LINKS
Scope Guru on Signal Integrity
January 10, 2012
Which jitter measurement is correct?
As you might have read in the last entry of 2011, Jit is sharing the blogger role...
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Anablog
September 2, 2010
Tektronix scope secret splash screens
I came across a wild picture while searching Google images for my upcoming article...
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Is it April...
John Bostock– 2012-10-2 01:27:00 PST
in response to Stable pulse generator uses matched transistors in a current mirrorThe circuit as shown does not detect shorts between unrelated pairs that have...
Dan Prysby– 2012-8-2 21:48:34 PST
in response to Simple circuit tests twisted-pair cablesThere's nothing modern about using transistors from the same wafer to get better...
Phil Hobbs– 2012-6-2 18:42:15 PST
in response to Stable pulse generator uses matched transistors in a current mirror
KNOWLEDGE CENTER
Product fEEd
EDN's technical editors highlight notable new products including analog and digital ICs, power components, sensors, passives, boards and systems, software, and more.
Murata Electronics LFB182G45BG2D280 filter: Filter targets 2.4-GHz wireless apps
TDK B32*6T film capacitors: MKP and MKT film capacitors have low insertion height
Triad Magnetics CMT-8100 common-mode inductors: Inductors eliminate noise in power-supply lines
Power Integrations DER-297 reference design: LED-driver reference design adds efficiency
Mitsubishi WVGA AA070MC01 and WXGA AA106TA01 LCD modules: Modules have 170° horizontal and vertical viewing angle
Sharp LS series of ultra-low-power memory LCDs: Series draws less power than conventional TFT LCDs
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Taking the Measure
Rick Nelson, editorial director of Test & Measurement World, comments on test, globalization, measurement, machine vision, economics, nanotechnology, the engineering profession, and more.
Latest Post: September 12, 2011
After more than 13 years at T&MW, I have decided to move on to a new position, but T&MW will be in good hands. Read More




