News
Implementation platform has two-times-faster throughput 10/22/2009
At the Design Automation Conference, which took place in San Francisco in July, Synopsys Inc highlighted the latest release of its Galaxy Implementation Platform, which, the company claims, delivers two-times-faster design implementation and sign-off throughput by leveraging multicore performance and MCMM (multicorner/multimode) technologies.Agilent ADS channel simulator mode determines ultralow bit-error rate in seconds 10/20/2009
The ADS channel simulator's new statistical mode supports the design and verification of high-speed, chip-to-chip data links found in most consumer and enterprise digital products produced today.High-performance MSOs feature 20-GHz analog bandwidth 10/12/2009
Tektronix has announced the MSO70000 series of MSOs (mixed-signal oscilloscopes), which it calls the first high-performance, integrated MSOs.RF-vector-signal generator combines high throughput, low phase noise 10/6/2009
Keithley Instruments has upgraded its RF-vector-signal-generator line with new capabilities that reduce signal-generation times and enhance signal quality. In contrast with competitive generators, which typically force users to choose between best signal quality and maximum test throughput, the Model 2920A combines both capabilities in the same instrument.Signal analyzers outshine spectrum-analyzer cousins 9/28/2009
Agilent named its new N9000A CXA and N9030A PXA series of RF-measurement and -analysis instruments “signal analyzers” because the company believes the units target a wider niche than do swept-frequency spectrum analyzers.In-Depth
Oscilloscope probe accessories—It's the little things that matter 10/30/2009
Probe accessories, including tips, caps, adapters, springs, positioners, clips, and hooks, can help you conveniently make accurate measurements.RF switching options: The right fit might come with a loss 9/17/2009
Manufacturers are offering SOI and MEMS alternatives to PIN-diode, GaAs, and electromechanical switches for a variety of RF applications, but you need to understand RF-switch specs before you commit to a new technology.EDA companies tout RF design, links to test 7/9/2009
From RF/microwave-circuit-design tools to electromagnetic simulation, EDA companies work with instrument vendors to get high-performance, high-quality products to market.RF Engineers Automate Tests 6/11/2009
Many test engineers sidestep the built-in capabilities in today's RF-test equipment and devise their own algorithms, applications, and automated tests.40- and 100-Gbps Ethernet brings new test challenges 4/23/2009
IEEE P802.3ba will define an architecture for 40- and 100-Gbps Ethernet, giving rise to new test equipment and test techniques.Experts
The design-and-test merger 6/26/2008
An effective design-and-test strategy will require a holistic effort across the entire chip-design and -production ecosystem.Pointy tips: How to straighten bent oscilloscope probe tips 5/29/2008
My high-speed-oscilloscope probes were bent so badly that they looked like elf shoes. Here's how I fixed them.Scrape it: How to probe a microstrip trace with no accessible test points or vias 4/28/2008
The lowly scraper is the best tool for the job. Given the right curvature, you can scrape a path just wide enough to reveal a trace under test without exposing other nearby features.External instruments here to stay 3/20/2008
Whatever the interface standard, real external instruments and systems that gather test data and external software that performs yield-learning and other analysis tasks must supplant embedded instruments.Setting up your oscilloscope to measure jitter 10/3/2007
Because real-time oscilloscopes are workhorses in any laboratory, it’s important to know how to get the most out of them. Jitter measurements are particularly sensitive to their environment.DesignIdeas
