ESC

Test & Measurement

Martin Rowe
Senior Technical Editor
Technical information about test and measurement equipment and strategies from the point of view of the R&D or design and development engineer. Topics include T&M hardware such as oscilloscopes and signal generators/analyzers, as well as software and test methodologies.

Upgraded handhelds ease mobile fronthaul and OTN testing

Anritsu has expanded the capabilities of its handheld MT1000A Network Master Pro and MT1100A Network Master Flex all-in-one transport testers with support for CPRI/OBSAI and RFC 6349 TCP throughput testing, OTN multi-stage mapping for OTU3/4, a remote operation tool, and a video inspection probe. Read More...

Which software automates your tests?

A poll on EE Times asks which of several software packages engineers use to automate tests. Tell us which you use. Read More...

Dual-band amp is tuned for higher power in radar bands

Operating at saturation, Milmega’s AS0104-800/400 dual-band amplifier produces maximum continuous-wave power of 800 W in a band of 1.2 GHz to 1.4 GHz and 400 W in a band of 2.7 GHz to 3.1 GHz, enabling it to meet automotive radar-pulse test requirements. Read More...

USB power sensors deliver fast measurements

Combining a broad measurement range of -60 dBm to +20 dBm with speeds of more than 1600 readings/s continuous and 11,000 readings/s buffered, the MA24208A and MA24218A USB power sensors from Anritsu increase throughput in any lab, high-volume manufacturing, or field environment. Read More...

My new home office: Update 4

Water damage, a new monitor, and a new personal laptop make big changes since Update 3 in 2012. Read More...

Moore’s Law creates new test product categories

Larry Desjardin looks at the rise and fall of test and measurement product categories since Moore’s historic paper. Read More...

Transient recorder streams 400 Mbytes/s to external PC

One of the fastest systems in the industry, the GEN7tA transient recorder and data-acquisition system from HBM acquires and streams data at a rate of up to 400 Mbytes/s to serve applications that require hundreds of channels and high sample rates. Read More...

Calibration means different things in different professions

Because the term "calibration" isn't listed in official government job listings, educators and job councilors might not guide people into the field. Read More...

Magnetic reconnection: behind the scenes of NASA’s MMS launch

UNH teamed with NASA and other universities to build components of the Magnetospheric MultiScale (MMS) mission. Here is Emily Clemons’ eyewitness account of the launch as well as details on UNH’s component designs. Read More...

Digital clamp meter measures up to 1500 A

Used for installing, maintaining, fault-finding, and monitoring of large electrical systems and equipment, the DCM1500 digital clamp meter from Megger measures AC and DC current up to 1500 A, providing true RMS reading on the AC range to achieve greater measurement accuracy. Read More...

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Simplified kurtosis computation detects signal interference

The statistical kurtosis operation, reinterpreted and implemented on an FPGA for this Design Idea, can detect various forms of interference in RF and other signals. Read More...

De-embed transmission lines with FIR filters

This DI uses MATLAB to design de-embedding filters which clean up high-speed signal measurements. Read More...

Instrumentation amp makes an accurate transimpedance amp too

The interesting topology in this Design Idea turns a monolithic in-amp into a good transimpedance amp for photodiode or similar applications. Read More...

Transient load gives power systems a workout

Verify power supply performance with this transient load generator. Read More...

Bad-bulb finder fixes Christmas lights

15 years later, here’s a new take on one of our most popular Design Ideas ever! Read More...

Power transient buffer enables IC & circuit testing

This DI lets you use a versatile function generator to test a circuit’s response to power transients and noise. Read More...

Antilog converter linearizes carbon dioxide sensor

Simplify gas sensor interface with some analog preprocessing. Read More...

Sub-picofarad measurement with CMOS inverters

Measure capacitance down to 2.5pF full-scale using this hex inverter-based design. Read More...

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Upgraded handhelds ease mobile fronthaul and OTN testing

Anritsu has expanded the capabilities of its handheld MT1000A Network Master Pro and MT1100A Network Master Flex all-in-one transport testers with support for CPRI/OBSAI and RFC 6349 TCP throughput testing, OTN multi-stage mapping for OTU3/4, a remote operation tool, and a video inspection probe. Read More...

Dual-band amp is tuned for higher power in radar bands

Operating at saturation, Milmega’s AS0104-800/400 dual-band amplifier produces maximum continuous-wave power of 800 W in a band of 1.2 GHz to 1.4 GHz and 400 W in a band of 2.7 GHz to 3.1 GHz, enabling it to meet automotive radar-pulse test requirements. Read More...

USB power sensors deliver fast measurements

Combining a broad measurement range of -60 dBm to +20 dBm with speeds of more than 1600 readings/s continuous and 11,000 readings/s buffered, the MA24208A and MA24218A USB power sensors from Anritsu increase throughput in any lab, high-volume manufacturing, or field environment. Read More...

Transient recorder streams 400 Mbytes/s to external PC

One of the fastest systems in the industry, the GEN7tA transient recorder and data-acquisition system from HBM acquires and streams data at a rate of up to 400 Mbytes/s to serve applications that require hundreds of channels and high sample rates. Read More...

Digital clamp meter measures up to 1500 A

Used for installing, maintaining, fault-finding, and monitoring of large electrical systems and equipment, the DCM1500 digital clamp meter from Megger measures AC and DC current up to 1500 A, providing true RMS reading on the AC range to achieve greater measurement accuracy. Read More...

Automated PHY test suite simplifies USB 3.1 compliance

With Teledyne LeCroy’s QPHY-USB3.1-Tx-Rx package for automated USB 3.1 transmitter and receiver compliance testing, characterization, and debugging, engineers can test both Gen1 (5-Gbps) and Gen2 (10-Gbps) devices in accordance with the latest USB 3.1 specifications. Read More...

Software toolset performs PAM-4 signal analysis

A set of software analysis tools for Teledyne LeCroy’s real-time oscilloscopes performs eye, jitter, and noise measurements on all three eye openings of a PAM-4 signal, an important requirement for engineers designing next-generation electrical and optical links that employ PAM-4 signaling to double data transfer rates. Read More...

Sigma-delta ADC provides precision measurements

Maxim Integrated's MAX11214, 24-bit, 5 mW, 140 dB SNR, 32 ksample/sec delta-sigma analog-to-digital converter includes an integrated programmable gain amplifier. Read More...

DC source simulates automotive-battery voltage drop

Well-suited for military, avionics, and automotive test environments, the VDS 200Q series of four-quadrant voltage-drop simulators from EM Test can source and sink current using a programmed voltage in both positive and negative polarities. Read More...

Handheld analyzer performs vector-voltmeter measurements

An optional vector-voltmeter mode for the microwave Site Master S820E from Anritsu—a handheld cable and antenna analyzer that offers coverage of up to 40 GHz—allows the S820E to serve as a drop-in replacement for legacy vector-voltmeter instruments. Read More...

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The Tektronix 1101 oscilloscope-probe power supply

A mechanical design is at once a masterpiece and an expensive expedient. Read More...

What's inside a smart meter? iFixit tears it down

When iFixit's Kyle Wiens had the opportunity to tear down an Elster smart meter, he jumped at it—not to come up with a repair manual but to evaluate the health and safety issues that seem to surround the utilities’ installation of smart meters. Read More...

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History of jitter, Part 3: BER as a function of jitter

Looking at BER as a function of jitter seen at a receiver depends on two things: how much jitter the signal has, and where the signal is being latched. Read on to find out more. Read More...

5G base station architecture, Part 1: Evolution

I thought that now would be a good time to review, with you the EDN design audience readership, where we are at technically with the formation of 5G technology in light of the recent Brooklyn 5G Summit that took place on April 8-10, 2015 jointly organized by Nokia Networks and the NYU Wireless research Center at Polytechnic School of Engineering at New York University. Read More...

Two common PDN measurement questions

Steve Sandler reveals two common questions he gets about power distribution networks, and then he provides detailed answers. Read More...

Product development takes teamwork, math, and smaller boxes

When Tektronix engineers set out to develop the company's latest high-performance oscilloscope, engineers had to abandon traditional ways of interleaving signals and packaging the product. This is the story of how the DPO70000SX developed. Read More...

History of jitter Part 2: Histograms

The late 1990s and the rise of statistical analysis as a tool to analyze jitter. Read More...

Signal processing boosts digitizer performance

Averaging, FFT, and filtering are just three of the ways that software can help you modify and analyze digitized waveforms. Read More...

History of jitter, Part 1: the early years

There's no simple, straight path through the history of jitter. Rather, it's a story of numerous instruments, inventors, and twists and turns. Read More...

Testing SATA DevSleep for today's power stingy SSDs

Before you can test the latest power-saving technology, you need to understand how it works. Read More...

How to extend calibration cycles

When your business case calls for a long calibration interval, you can use CALT techniques to verify design stability. Read More...

A single misplaced atom can cause a system failure

Inside a semiconductor, a single atom deposited in the wrong place can cause the device to fail. Failure analysis and inspection can uncover the failure. Read More...

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Which software automates your tests?

A poll on EE Times asks which of several software packages engineers use to automate tests. Tell us which you use. Read More...

My new home office: Update 4

Water damage, a new monitor, and a new personal laptop make big changes since Update 3 in 2012. Read More...

Moore’s Law creates new test product categories

Larry Desjardin looks at the rise and fall of test and measurement product categories since Moore’s historic paper. Read More...

Calibration means different things in different professions

Because the term "calibration" isn't listed in official government job listings, educators and job councilors might not guide people into the field. Read More...

Magnetic reconnection: behind the scenes of NASA’s MMS launch

UNH teamed with NASA and other universities to build components of the Magnetospheric MultiScale (MMS) mission. Here is Emily Clemons’ eyewitness account of the launch as well as details on UNH’s component designs. Read More...

DesignCon 2016 opens call for papers

It’s time to sharpen your virtual pencils and submit your ideas for next year’s DesignCon. If your work concerns signal integrity, power integrity, or the interference between the two in high-speed designs, then DesignCon is the conference for you to show your work and get the feedback of your peers. Read More...

Football and the Ideal Gas Law

The numbers show that the NFL should stay out of the measurement business. Read More...

Why FEC plays nice with DFE

FEC (Forward Error Correction) spends bandwidth to buy BER (bit error ratio), but it has to work just right or the whole thing falls apart. Read More...

Advanced radiated emissions troubleshooting setups with the Rigol DSA815

Many product designers and EMI engineers are using the popular Rigol DSA815 spectrum analyzer for EMI troubleshooting and pre-compliance testing. I’d like to demonstrate the instrument settings and measurement features I most commonly use when troubleshooting radiated emissions in the 30 to 1000 MHz region. You’ll find these useful for either near field probing or testing emissions using a nearby EMI antenna. Read More...

ARM TechCon opens call for proposals

Proposals now being accepted for ARM TechCon 2015, which will take place November 10-12, 2015 Read More...

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