ESC Con 2015

Test & Measurement

Martin Rowe
Senior Technical Editor
Technical information about test and measurement equipment and strategies from the point of view of the R&D or design and development engineer. Topics include T&M hardware such as oscilloscopes and signal generators/analyzers, as well as software and test methodologies.

National Instruments ups PXI game to Gen 3

Why is National Instruments bringing PXI speeds to the next generation? Larry Desjardin interviews NI, and explains. Read More...

Data-acquisition: The key to a smart electrical grid

Data acquisition of voltage, current, and power has become essential to the operation of today's smart-grid power distribution network. Read More...

Tektronix enters RF signal-generator market

Tektronix goes into a crowded field with the TSG4100A series of analog/vector signal generators at 2 GHz, 4 GHz, and 6 GHz. Read More...

Keysight expands bench DMM line to 7½ digits

The 34470A (7.5 digit) and 34465A (6.5 digit) increase the Truevolt series from two to four models. Read More...

Farewell, Leonard Nimoy

EDN bids farewell to the actor who inspired many to become engineers and scientists. Read More...

A data-acquisition system on a chip

Analog Devices has introduced the AD5592R, which contains all the functions you need to build a multifunction data-acquisition system, including ADCs, DACs, and digital I/O, on a single IC. Read More...

Measure of neutrinos, nature's most elusive particles

When neutrinos pass through matter, they rarely leave a trace, but when they do, it comes in the form of a ghostly ultra-violet cone of light. Read More...

See the latest in communications test at MWC 2015

Mobile World Congress 2015 will highlight top trends such as 5G, LTE-A and carrier aggregation. Read More...

BER test method uses real data

A proposed test method from the UNH-IOL shows promise for testing serial data links such as PCIe and SATA without the drawbacks of using predefined test patterns. Read More...

Simultaneous time, frequency domain analysis at 1 GHz

Rohde & Schwarz' RTM bench oscilloscopes can now simultaneously analyze analog, digital, protocol-based and RF signals. This spectrum analysis and spectrogram option can also be used in the new 1 GHz model. Read More...

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Transient load gives power systems a workout

Verify power supply performance with this transient load generator. Read More...

Bad-bulb finder fixes Christmas lights

15 years later, here’s a new take on one of our most popular Design Ideas ever! Read More...

Power transient buffer enables IC & circuit testing

This DI lets you use a versatile function generator to test a circuit’s response to power transients and noise. Read More...

Antilog converter linearizes carbon dioxide sensor

Simplify gas sensor interface with some analog preprocessing. Read More...

Sub-picofarad measurement with CMOS inverters

Measure capacitance down to 2.5pF full-scale using this hex inverter-based design. Read More...

Short circuit tracer/finder uses low power

Build this bench tool and become a master at pinpointing shorts. Read More...

LabVIEW real-time seismic alert system

National Instrument’s LabVIEW has uses beyond instrument control, as demonstrated by this Web app. Read More...

LTC Design Note: Robust 10MHz reference clock input protection circuit and distributor for RF systems

Design a protected 10MHz reference input without degrading phase noise. Read More...

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Tektronix enters RF signal-generator market

Tektronix goes into a crowded field with the TSG4100A series of analog/vector signal generators at 2 GHz, 4 GHz, and 6 GHz. Read More...

Keysight expands bench DMM line to 7½ digits

The 34470A (7.5 digit) and 34465A (6.5 digit) increase the Truevolt series from two to four models. Read More...

A data-acquisition system on a chip

Analog Devices has introduced the AD5592R, which contains all the functions you need to build a multifunction data-acquisition system, including ADCs, DACs, and digital I/O, on a single IC. Read More...

Multipath sensors enable fast power measurements

Rohde & Schwarz has expanded its sensor portfolio with three-path diode power sensors that supply USB and Ethernet interfaces, as well as improved measurement speed and accuracy. Read More...

Simultaneous time, frequency domain analysis at 1 GHz

Rohde & Schwarz' RTM bench oscilloscopes can now simultaneously analyze analog, digital, protocol-based and RF signals. This spectrum analysis and spectrogram option can also be used in the new 1 GHz model. Read More...

Inspection system checks LED color and intensity

EVT has devloped the EyeSens MCI multi-color inspection system for measuring objects for color and intensity with the integrated EyeVision image processing software. Read More...

Software hones spectrum analyzer performance

A free software upgrade from Signal Hound offers a single graphical user interface to control the SA series of USB-powered spectrum analyzers and the TG series of tracking generators, providing real-time spectrum analysis for SA devices and improved stability and high dynamic range for TG units. Read More...

Power analyzer integrates an oscilloscope

The IntegraVision Power Analyzer from Keysight Technologies combines the accuracy and resolution of a power analyzer with the familiarity of an oscilloscope. Read More...

Test cables with this portable kit

The Net Prowler PRO Test Kit provides a handheld cable tester and numerous attachments. Read More...

Oscilloscope platform analyzes three-phase motor drives

Teledyne LeCroy’s MDA8000 series of motor-drive analyzers performs three-phase power-analyzer static (steady-state) calculations, dynamic three-phase power and mechanical motor analysis, and high-bandwidth embedded control-system debugging. Read More...

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The Tektronix 1101 oscilloscope-probe power supply

A mechanical design is at once a masterpiece and an expensive expedient. Read More...

What's inside a smart meter? iFixit tears it down

When iFixit's Kyle Wiens had the opportunity to tear down an Elster smart meter, he jumped at it—not to come up with a repair manual but to evaluate the health and safety issues that seem to surround the utilities’ installation of smart meters. Read More...

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Data-acquisition: The key to a smart electrical grid

Data acquisition of voltage, current, and power has become essential to the operation of today's smart-grid power distribution network. Read More...

BER test method uses real data

A proposed test method from the UNH-IOL shows promise for testing serial data links such as PCIe and SATA without the drawbacks of using predefined test patterns. Read More...

Cable tips for your next measurement

Measurements are often hanging by a cable; Steve Sandler explains why the purchase of a “good” cable may not be sufficient, and provides tips for what you should do for every measurement. Read More...

Characterize interconnects with S-parameters

What can S-parameters reveal about interconnects? Read More...

Annotate oscilloscope displays for better documentation

Take advantage of your digital oscilloscope to display pertinent measurement information and operator instructions right on the screen. You'll then know what you're looking at. Read More...

100G standards and measurements come to the forefront at DesignCon

In two short videos, EDN's Senior Technical Editor Martin Rowe talks with Chris Loberg about the current state of 100G standards and measurements. Read More...

USB 3.1 testing: Start to finish, part 1

Learn the basics of transmitter and receiver testing for the latest version of USB, which operates at 10 Gbits/s. Read More...

Deliver the power

Many of today's signal-integrity problems are really power-delivery problems. Read More...

Stressing of redundant memory bits during burn-in test

Uniformly stress-test memory during burn-in, including the spare cells. Read More...

DesignCon 2015: Focus on test and measurement

Get a preview of some test equipment you'll see at DesignCon 2015. Read More...

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National Instruments ups PXI game to Gen 3

Why is National Instruments bringing PXI speeds to the next generation? Larry Desjardin interviews NI, and explains. Read More...

Failed solder joint makes car clock go dark

When the clock on my Subaru Forester went dark, fixing a poor solder joint brought it back to light. Read More...

Farewell, Leonard Nimoy

EDN bids farewell to the actor who inspired many to become engineers and scientists. Read More...

Measure of neutrinos, nature's most elusive particles

When neutrinos pass through matter, they rarely leave a trace, but when they do, it comes in the form of a ghostly ultra-violet cone of light. Read More...

DesignCon and the future of bench instrumentation – Part 2

Why are there are so many form factors on the lab bench? Larry Desjardin describes the dynamics behind them, and where they are going. Read More...

Attend IJTAG workshop series for designers and test managers

Intended for board designers, test managers, and DFx engineers, the free half-day workshops show how to re-use embedded instrument IP, reducing costs in chips and circuit boards. Read More...

Software tool fixes some causality violations

While walking the exhibit floor at DesignCon 2015, Eric Bogatin found a new tool from Ataitec Corp that prevents causality violations. Read More...

Wi-Fi network interference, analysis, and optimization

One aspect related to EMC today is that, with the proliferation of embedded wireless systems in all imaginable products, comes the risk of increasing interference and resulting slowdown in data transfer. We'll discuss how wireless networks work, the typical interfering sources and how best to manage your system. Read More...

DesignCon and the future of bench instrumentation

DesignCon offers vital clues about the form factors and use models we will find on the lab bench of the future. Read More...

Is PAM4 ready for prime time?

Not everyone believes PAM4 will become the industry standard for data communications at 56 Gbit/s. In this video, two backplane designers explain why. Read More...

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