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Test & Measurement

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Janine Love
Senior Editor, Test & Measurement, Wireless/Networking
Technical information about test and measurement equipment and strategies from the point of view of the R&D or design and development engineer. Topics include T&M hardware such as oscilloscopes and signal generators/analyzers, as well as software and test methodologies.
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Agilent expands signal analyzer bandwidth and adds real-time capability

In recognition of the needs of next-generation wireless networks, Agilent announced new options for its midrange N9020A MXA X-series signal analyzer. Read More...

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Fluke brings new capabilities to cable certification

Featuring interchangeable modules for copper, fiber and OTDR testing, Fluke Networks Versiv testers address system acceptance for copper and fiber jobs. Read More...

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Spectrum unveils PCIe instrumentation platform

German manufacturer Spectrum has released the M4i.445x-x8, the first card in its M4i series of high-speed PCI Express digitizers capable of delivering a synchronous sampling speed of 500 Msamples/s with 14-bit A/D resolution. Read More...

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R&S doubles signal analyzer’s analysis bandwidth

Rohde & Schwarz has extended the analysis bandwidth of its high-end FSW signal and spectrum analyzer from 160 MHz to 320 MHz, allowing the instrument to be used in a variety of applications related to wideband digital communications and radar systems. Read More...

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Spectra2 XL3 tackles LTE core testing

New Tektronix Communications product tests IP multimedia subsystems (IMS) and evolved packet core (EPC) on a single platform Read More...

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How are you measuring that power consumption?

Everyone talks about power consumption, but measuring it can be a challenge. Read More...

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Chipheads unite: DesignCon 2014 calls for papers

If you are ready to share your expertise with the chip, board & systems design community, then it’s time to submit your proposals for the DesignCon 2014 Technical Program. Read More...

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How to measure instantaneous RF power

Oscilloscopes can help designers of quadrature-modulation-based communications systems evaluate dynamic power requirements by providing a fast method to measure instantaneous power on very long data records. Read More...

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Turn a smart phone into a signal generator

Signal generators are a handy thing to have around the lab, but rather than carry around another device with a computer in it, utilize the computing power and capabilities of a smart phone. Read More...

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12-bit ADCs handle up to 900 Msamples/s

Comprising six single-channel and dual-channel models, Texas Instruments’ ADS5409 family of 12 bit ADCs offers sampling speeds ranging from 500 Msamples/s to 900 Msamples/s, while reducing board space requirements by 80%. Read More...

>> SEE ALL
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Complete, low-cost, software programmable ohmmeter measures micro-ohms

An ac voltage is generated by switching current into the unknown resistance. The resulting ac voltage is then amplified and filtered to produce an output voltage proportional to the resistance being measured. Read More...

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Convert your smartphone into a pedometer and tracking device

A bit of Python code along with the power of GPS and your smartphone lets you track and record your outdoor excursion activities. Read More...

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Photo meter assesses ambient light

When most PN-junction diodes are reverse biased, they will produce a small photovoltaic output as the light level is increased. Read More...

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Circuit automatically switches off DMM

Add automatic-shutoff to your DMM, save batteries, and eliminate wear and tear on the function switch. Read More...

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Create secondary colors from multicolored LEDs

One disadvantage of generating a yellow color by mixing two primary-color light sources is that the LED must use twice the current because both the red and the green LEDs must be on. Read More...

Measure an amplifier's THD without external filters

Adding a secondary amplifier boosts the THD to measurable levels. Read More...

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Wireless temperature monitor has data-logging capabilities

You can make a wireless temps system with two ICs. Read More...

Make an asynchronous clock for VPX-based PCIe systems

Careful crystal selection and an FPGA are key to success. Read More...

>> SEE ALL
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Agilent expands signal analyzer bandwidth and adds real-time capability

In recognition of the needs of next-generation wireless networks, Agilent announced new options for its midrange N9020A MXA X-series signal analyzer. Read More...

image

Fluke brings new capabilities to cable certification

Featuring interchangeable modules for copper, fiber and OTDR testing, Fluke Networks Versiv testers address system acceptance for copper and fiber jobs. Read More...

image

Spectrum unveils PCIe instrumentation platform

German manufacturer Spectrum has released the M4i.445x-x8, the first card in its M4i series of high-speed PCI Express digitizers capable of delivering a synchronous sampling speed of 500 Msamples/s with 14-bit A/D resolution. Read More...

image

R&S doubles signal analyzer’s analysis bandwidth

Rohde & Schwarz has extended the analysis bandwidth of its high-end FSW signal and spectrum analyzer from 160 MHz to 320 MHz, allowing the instrument to be used in a variety of applications related to wideband digital communications and radar systems. Read More...

image

Spectra2 XL3 tackles LTE core testing

New Tektronix Communications product tests IP multimedia subsystems (IMS) and evolved packet core (EPC) on a single platform Read More...

image

12-bit ADCs handle up to 900 Msamples/s

Comprising six single-channel and dual-channel models, Texas Instruments’ ADS5409 family of 12 bit ADCs offers sampling speeds ranging from 500 Msamples/s to 900 Msamples/s, while reducing board space requirements by 80%. Read More...

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Rohde & Schwarz adds logic analysis to bench scopes

The R&S RTM series from Rohde & Schwarz offer 20 Msamples deep memory and a logic analysis option with 16 digital channels in a “lower end” scope. Read More...

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Modular test unit assesses infotainment video data

The Video Dragon (basicCON 4121) from Goepel electronic lets engineers test the high-speed LVDS connections and HDMI interfaces used in automotive infotainment components. Read More...

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R&S adds midrange models to network-analyzer family

Two new models join the ZNB series of vector network analyzers from Rohde & Schwarz: the midrange ZNB20 and ZNB40 for frequency ranges of 100 kHz to 20 GHz and 10 MHz to 40 GHz, respectively. Read More...

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Signal analyzer locates short, sporadic events

A measurement option from Rohde & Schwarz for its FSW high-end signal and spectrum analyzer enables real-time signal analysis for frequencies of up to 50 GHz with an analysis bandwidth of 160 MHz. Read More...

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The Tektronix 1101 oscilloscope-probe power supply

A mechanical design is at once a masterpiece and an expensive expedient. Read More...

What's inside a smart meter? iFixit tears it down

When iFixit's Kyle Wiens had the opportunity to tear down an Elster smart meter, he jumped at it—not to come up with a repair manual but to evaluate the health and safety issues that seem to surround the utilities’ installation of smart meters. Read More...

>> SEE ALL
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How to measure instantaneous RF power

Oscilloscopes can help designers of quadrature-modulation-based communications systems evaluate dynamic power requirements by providing a fast method to measure instantaneous power on very long data records. Read More...

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Test automation fundamentals

Careful planning and implementation around element locator strategies can yield incredible results for automation suites. Read More...

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Key factors determine an independent test laboratory’s credentials

Chip complexity requires increased testing sophistication, so technical testing laboratories must measure up when conducting functional and/or anti-counterfeit testing Read More...

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Electronic test 1936-1955 (A Look Back, Part 3)

Ever wonder what HP's first product looked like? How about Keithley's? Check out this slideshow of some old test equipment, back in the day when test equipment was more hardware than software...and sometimes took four hours to warm up! Read More...

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How to use ECC to protect embedded memories

Multi-bit error correction and automation can be used to meet reliability and volume production goals Read More...

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Electronic test 1956-1987 (A Look Back: Part 2)

Now here's some old electronic test equipment! Anyone have these in your lab, basement, memories? Read More...

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Electronic test 1988-2000 (A Look Back: Part 1)

Check out this slide show of some of historic test equipment. This is Part 1 of 3. The total series spans 1936-2000. Read More...

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How to validate and analyze complex serial-bus-link models

The goal is to measure the DUT and not the test equipment, fixtures, or cables that are used to acquire the signal. The act of removing the effects of any of these elements can result in a significant improvement in the margin of the device. Read More...

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Ensure FinFET defect coverage with cell-aware test

The cell-aware test approach to internal cell defect coverage is fully capable of targeting new FinFET defect mechanisms and should prove indispensable in ensuring necessary quality in upcoming designs. Read More...

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Target impedance based solutions for PDN may not provide realistic assessment

This article focuses on the fundamental flaws of using target impedance as an assessment method using simple, lumped element models and simulations to highlight some of the key issues. Read More...

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ASK & ANSWER

FPGAs, the new test and measurement enabler?

When I was at IMS2012 recently in Montreal, there was some talk about how FPGAs are being used in test equipment to speed up performance... Read more...

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