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Test & Measurement

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Janine Love
Editor in Chief
Technical information about test and measurement equipment and strategies from the point of view of the R&D or design and development engineer. Topics include T&M hardware such as oscilloscopes and signal generators/analyzers, as well as software and test methodologies.
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Electronic test 1936-1955, slideshow (Part 3)

Ever wonder what HP's first product looked like? How about Keithley's? Check out this slideshow of some old test equipment, back in the day when test equipment was more hardware than software...and sometimes took four hours to warm up! Read More...

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Aeroflex outfits radio tester with TEDS option

Engineers can now use the 3920 digital and analog radio test set from Aeroflex to verify the operation of TEDS (TETRA Enhanced Data Service) mobile stations and base stations. Read More...

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How to use ECC to protect embedded memories

Multi-bit error correction and automation can be used to meet reliability and volume production goals Read More...

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PXIe power supplies afford high power density

Useful for a range of applications, from aerospace and defense to automotive and component test, the PXIe-4112 and PXIe-4113 programmable power supplies from National Instruments each provide two 60-W power-supply channels from a single PXI Express slot. Read More...

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Electronic test 1956-1987 (A Look Back: Part 2)

Now here's some old electronic test equipment! Anyone have these in your lab, basement, memories? Read More...

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R&S vector signal generator simplifies network test

Aiming to simplify 4G device testing, the new R&S SMW200A generates complex signals for LTE-Advanced and next generation mobile standards Read More...

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Family of modules provides all-in-one LTE connectivity for M2M

French 4G chipmaker Sequans Communications has introduced a new line of LTE modules with a complete RF front end and key interfaces in a single, compact package for M2M designs. Read More...

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Geotest grows line of PXI/PXI Express chassis

Two new models join Geotest–Marvin Test Systems’ broad line of PXI chassis: the GX7200, a 21-slot PXI Express chassis, and the GX7800, an 8-slot PXI chassis. Read More...

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Upgraded DC electronic loads handle up to 800 A

Kepco has introduced several enhancements to its EL series of single- and dual-channel DC electronic loads, including increased current capability of up to 800 A at 5 kW for all low-voltage models. Read More...

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Electronic test 1988-2000 (A Look Back: Part 1)

Check out this slide show of some of historic test equipment. This is Part 1 of 3. The total series spans 1936-2000. Read More...

>> SEE ALL
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Complete, low-cost, software programmable ohmmeter measures micro-ohms

An ac voltage is generated by switching current into the unknown resistance. The resulting ac voltage is then amplified and filtered to produce an output voltage proportional to the resistance being measured. Read More...

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Convert your smartphone into a pedometer and tracking device

A bit of Python code along with the power of GPS and your smartphone lets you track and record your outdoor excursion activities. Read More...

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Photo meter assesses ambient light

When most PN-junction diodes are reverse biased, they will produce a small photovoltaic output as the light level is increased. Read More...

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Circuit automatically switches off DMM

Add automatic-shutoff to your DMM, save batteries, and eliminate wear and tear on the function switch. Read More...

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Create secondary colors from multicolored LEDs

One disadvantage of generating a yellow color by mixing two primary-color light sources is that the LED must use twice the current because both the red and the green LEDs must be on. Read More...

Measure an amplifier's THD without external filters

Adding a secondary amplifier boosts the THD to measurable levels. Read More...

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Wireless temperature monitor has data-logging capabilities

You can make a wireless temps system with two ICs. Read More...

Make an asynchronous clock for VPX-based PCIe systems

Careful crystal selection and an FPGA are key to success. Read More...

>> SEE ALL
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Aeroflex outfits radio tester with TEDS option

Engineers can now use the 3920 digital and analog radio test set from Aeroflex to verify the operation of TEDS (TETRA Enhanced Data Service) mobile stations and base stations. Read More...

image

PXIe power supplies afford high power density

Useful for a range of applications, from aerospace and defense to automotive and component test, the PXIe-4112 and PXIe-4113 programmable power supplies from National Instruments each provide two 60-W power-supply channels from a single PXI Express slot. Read More...

image

R&S vector signal generator simplifies network test

Aiming to simplify 4G device testing, the new R&S SMW200A generates complex signals for LTE-Advanced and next generation mobile standards Read More...

image

Geotest grows line of PXI/PXI Express chassis

Two new models join Geotest–Marvin Test Systems’ broad line of PXI chassis: the GX7200, a 21-slot PXI Express chassis, and the GX7800, an 8-slot PXI chassis. Read More...

image

Upgraded DC electronic loads handle up to 800 A

Kepco has introduced several enhancements to its EL series of single- and dual-channel DC electronic loads, including increased current capability of up to 800 A at 5 kW for all low-voltage models. Read More...

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2U programmable-supply family delivers 200 W to 800 W

TDK-Lambda has expanded its Z+ series of programmable DC supplies with the addition of models that furnish 800 W of output power, as well as a selection of output-voltage ranges covering 0 to 100 VDC and output current of up to 72 A. Read More...

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Value bench multimeter employs 5-1/2-digit dual display

With a price tag of just $449, the DM3058E digital multimeter from Rigol Technologies sports a dual display and 5-1/2-digit (240,000-count) resolution for basic bench measurements, while software options enable datalogging and remote SCPI programming from almost any interface. Read More...

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Ground-bond instrument meets alternative-energy test needs

Part of the HYAMP III series of manual ground-bond testers from Associated Research, the Model 3145 provides up to 40 A of DC ground-bond test current for alternative-energy and solar test applications. Read More...

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Message automation tool supports LTE X2 interface

GL Communications has introduced an LTE X2 interface emulator to test and verify eNodeB implementations through its MAPS (Message Automation & Protocol Simulation) platform, a protocol simulation and conformance test tool that can emulate a variety of protocols over IP, TDM, and wireless networks. Read More...

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Thin-film metrology system targets 28-nm nodes and below

Using a focused-beam ellipsometer and small-site measurement optics, Rudolph Technologies’ S3000SX thin-film metrology system for 2X and 1X process nodes measures the thickness of single-layer and multilayer transparent films on product wafers and within die areas as small as 30x30 µm. Read More...

>> SEE ALL

The Tektronix 1101 oscilloscope-probe power supply

A mechanical design is at once a masterpiece and an expensive expedient. Read More...

What's inside a smart meter? iFixit tears it down

When iFixit's Kyle Wiens had the opportunity to tear down an Elster smart meter, he jumped at it—not to come up with a repair manual but to evaluate the health and safety issues that seem to surround the utilities’ installation of smart meters. Read More...

>> SEE ALL
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Electronic test 1936-1955, slideshow (Part 3)

Ever wonder what HP's first product looked like? How about Keithley's? Check out this slideshow of some old test equipment, back in the day when test equipment was more hardware than software...and sometimes took four hours to warm up! Read More...

image

How to use ECC to protect embedded memories

Multi-bit error correction and automation can be used to meet reliability and volume production goals Read More...

image

Electronic test 1956-1987 (A Look Back: Part 2)

Now here's some old electronic test equipment! Anyone have these in your lab, basement, memories? Read More...

image

Electronic test 1988-2000 (A Look Back: Part 1)

Check out this slide show of some of historic test equipment. This is Part 1 of 3. The total series spans 1936-2000. Read More...

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How to validate and analyze complex serial-bus-link models

The goal is to measure the DUT and not the test equipment, fixtures, or cables that are used to acquire the signal. The act of removing the effects of any of these elements can result in a significant improvement in the margin of the device. Read More...

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Ensure FinFET defect coverage with cell-aware test

The cell-aware test approach to internal cell defect coverage is fully capable of targeting new FinFET defect mechanisms and should prove indispensable in ensuring necessary quality in upcoming designs. Read More...

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Target impedance based solutions for PDN may not provide realistic assessment

This article focuses on the fundamental flaws of using target impedance as an assessment method using simple, lumped element models and simulations to highlight some of the key issues. Read More...

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Inexpensive ways to test radiated immunity

Want to avoid troubleshooting while at an expensive test facility? Most don’t have the means to perform formal radiated immunity testing, but here’s how to evaluate pre-compliance using simple low-cost instruments. Read More...

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Profiles in Test: Eric Starkloff, NI

Sixteen years ago, Eric Starkloff joined NI as an applications engineer after earning a bachelor’s degree from the University of Virginia. Starkloff reflects on his career, advice for new engineers, as well as surprises and laughs along the way. Read More...

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Compare low-cost spectrum analyzers

Ken Wyatt tries out a number of low-cost spectrum analyzer options, particularly for EMC applications. Read More...

>> SEE ALL
ASK & ANSWER

FPGAs, the new test and measurement enabler?

When I was at IMS2012 recently in Montreal, there was some talk about how FPGAs are being used in test equipment to speed up performance... Read more...

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ASK & ANSWER
Using an EPROM as a detector?
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ASK & ANSWER
What To Do When A Device Does Not Pass EMC Testing
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ASK & ANSWER
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