Test & Measurement Design Articles

Too many clip leads? Make your own organizer

Sometimes, all you need is a little engineering and some household materials to solve a problem. Best of all, no software needed. Read More...

The confidence interval: How it relates to serial data links

The next time a young engineer says "I'm 99% sure of the result," ask if he or she has numbers to back up the claim. Read More...

Power driver design handles difficult loads, helps characterize PSUs

Dynamically testing and characterizing power supply subsystems can be tricky. This well-behaved driver circuit will simplify the task. Read More...

Analyze noise with time, frequency, and statistics

Random processes such as noise and jitter are associated with all electronic circuit components. Noise can be characterized using digital Read More...

Guard techniques for high-Z test-point muxes

Large test systems can easily affect the DUT. Use the techniques described here to make your test system almost transparent. Read More...

802.11ax: Not just another higher data rate

IEEE 802.11ax, with its dynamic spectrum allocation and power control, will require new test methods. Read More...

Product Engineering: The bridge between design and manufacturing

Product engineers at Maxim Integrated put first silicon through its paces, verifying specs and functions. They also make sure that test engineering Read More...

Calibrate voltage drops and interrupts before testing

Follow these techniques for calibrating a signal generator used to create drops and dips in power-supply voltage for testing automotive (or any Read More...

Vector signal analysis in an oscilloscope

See how a well-appointed oscilloscope can play the role of a complete vector-modulated-signal analysis system and experimentation laboratory. Read More...

Evaluate reference clocks for serial-data jitter specifications

Measurement techniques used for jitter don't let you predict how a reference clock will operate in a real application. Read More...

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