Test & Measurement Design Articles

Guard techniques for high-Z test-point muxes

Large test systems can easily affect the DUT. Use the techniques described here to make your test system almost transparent. Read More...

802.11ax: Not just another higher data rate

IEEE 802.11ax, with its dynamic spectrum allocation and power control, will require new test methods. Read More...

Product Engineering: The bridge between design and manufacturing

Product engineers at Maxim Integrated put first silicon through its paces, verifying specs and functions. They also make sure that test engineering Read More...

Calibrate voltage drops and interrupts before testing

Follow these techniques for calibrating a signal generator used to create drops and dips in power-supply voltage for testing automotive (or any Read More...

Vector signal analysis in an oscilloscope

See how a well-appointed oscilloscope can play the role of a complete vector-modulated-signal analysis system and experimentation laboratory. Read More...

Evaluate reference clocks for serial-data jitter specifications

Measurement techniques used for jitter don't let you predict how a reference clock will operate in a real application. Read More...

Detect and analyze EFT events

Electrical fast transients can disturb electronic circuits. Using an oscilloscope, you can find these pulses, display them, and calculate their Read More...

Move ICs from defects per million to defects per billion

Manufacturing and quality engineers need to find defects before they occur, especially for parts used in automotive and medical applications. You can Read More...

Digital oscilloscopes: When things go wrong

Learn how to avoid aliasing, false modulation, and false overshoot by properly using your oscilloscope settings. Read More...

Low-voltage tests uncover low-temperature IC problems

Testing automotive ICs with low voltages let us find and eliminate failures that only occur at low temperatures. Read More...

FEATURED RESOURCES