Failure and Yield Analysis

This 3 day course offers detailed instruction on a variety of effective tools, as well as the overall process flow for locating and characterizing the defect responsible for the failure.

Location: Tel Aviv, Israel
Date: 8/5/2008 - 8/7/2008
Organizer: Semitracks Inc

This 3 day course offers detailed instruction on a variety of effective tools, as well as the overall process flow for locating and characterizing the defect responsible for the failure. This course is designed for every manager, engineer, and technician working in the semiconductor field, using semiconductor components or supplying tools to the industry. By focusing on a Do It Right the First Time approach to the analysis, participants will learn the appropriate methodology to successfully locate defects, characterize them, and determine the root cause of failure. Participants learn to develop the skills to determine what tools and techniques should be applied, and when they should be applied. This 3 day course offers detailed instruction on a variety of effective tools, as well as the overall process flow for locating and characterizing the defect responsible for the failure.

Event Link:http://www.semitracks.com/courses/fa-course.htm