International Test Conference (ITC)
ITC is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and design improvement.
Location: Austin TX
Date: 11/1/2009 - 11/6/2009
Organizer: IEEE Computer Society
At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.
Event Link:http://www.itctestweek.org/