Failure and Yield Analysis

Failure and Yield Analysis is an increasingly difficult and complex process; engineers are required to locate defects on complex integrated circuits.

Location: San Jose, CA
Date: 2/1/2010 - 2/4/2010
Organizer: Semitracks

In many ways, this is akin to locating a needle in a haystack, where the needles get smaller and the haystack gets bigger every year. Engineers are required to understand a variety of disciplines in order to effectively perform failure analysis. This requires knowledge of subjects like: design, testing, technology, processing, materials science, chemistry, and even optics! Failed devices and low yields can lead to customer returns and idle manufacturing lines that can cost a company millions of dollars a day. Your industry needs competent analysts to help solve these problems. This is a multi-day course that offers detailed instruction on a variety of effective tools, as well as the overall process flow for locating and characterizing the defect responsible for the failure.

Event Link:http://www.semitracks.com/index.php?option=com_content&view=article&id=24&Itemid=33