Monday, June 15, 2009

Design and test highlights at the microwave show


I attended the IEEE MTT-S International Microwave Symposium last week, where I saw a variety of design and test products, ranging from RF-friendly EDA tools to high-volume production-test-worthy instruments. Of particular note was an emphasis on the 60-GHz ISM band for HD transmission within the home. Here are some highlights (click each link for details):

• Keithley upgrades RF vector signal analyzer, introduces upconverter.

• Design mingles with test as Agilent’s Solomon touts measurement focus.

• Noisecom, Rohde & Schwarz demo 60-GHz noise-figure measurement.

• Giga-tronics introduces fast-switching 50-GHz signal generators.

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• National Instruments highlights WiMAX test.

• Anritsu debuts VNAs and power sensors.

• Tektronix addresses RF/Microwave challenges, hosts Mesuro at IMS booth.

• Aeroflex expands PXI platform with high-power signal generators.

• Boonton introduces peak power sensor.

• Rohde & Schwarz demos coherent-source, nonstandard-OFDM, and group-delay measurements; touts AWR link.

• Nokia exec touts open innovation.

• Synopsys releases Custom Designer 2009.06, touts RF prowess.

• CST highlights simulation and solver tools.

• Crystek debuts pocket reference oscillator.

• Richardson Electronics adds test product line from W L Gore.

• Centellax previews 10-MHz to 50-GHz power amplifier.

Also, read our preshow interview with Fred Schindler, general chair of this year's IMS and director of RF Micro Devices' Boston Design Center.



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