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RF-vector-signal generator combines high throughput, low phase noise 10/6/2009
Keithley Instruments has upgraded its RF-vector-signal-generator line with new capabilities that reduce signal-generation times and enhance signal quality. In contrast with competitive generators, which typically force users to choose between best signal quality and maximum test throughput, the Model 2920A combines both capabilities in the same instrument.Signal analyzers outshine spectrum-analyzer cousins 9/28/2009
Agilent named its new N9000A CXA and N9030A PXA series of RF-measurement and -analysis instruments “signal analyzers” because the company believes the units target a wider niche than do swept-frequency spectrum analyzers.SuperSpeed USB test suite eliminates the need to integrate multiple suppliers’ system components 9/28/2009
LeCroy Corp has introduced a single-source lineup of test instruments that comprehensively support the USB (Universal Serial Bus) 3.0 standard.Onboard FPGAs enable high-performance ADC modules to analyze data at unprecedented speeds 9/22/2009
Agilent’s Acqiris product group recently announced three high-speed, high-accuracy, wide-dynamic-range, modular digitizers.Versatile audio analyzer easily quantifies performance of audio components, products 8/18/2009
Agilent Technologies has introduced the U8903A audio analyzer, a single unit that incorporates the broad range of capabilities you need to quantify the characteristics that affect sound quality in audio devices.High-bandwidth differential solder-in scope probes reduce rise times, ac loading, and probe noise 8/11/2009
LeCroy’s line of WaveLink high-bandwidth differential solder-in probes provides rise-time performance of 20 psec for a 20-GHz probe with a 20-GHz oscilloscope.National Instruments simplifies motion control 8/10/2009
National Instruments at NIWeek announced the new LabView NI SoftMotion module, which simplifies the development of advanced single- and multi-axis motion applications, and new NI C Series modules, which expand the connectivity of the NI CompactRIO programmable automation controller platform.LabView 2009 adds multicore support for embedded design 8/4/2009
National Instruments at its NIWeek event debuted LabView 2009 graphical system design software platform for control, test and embedded system development.Trigger, decode, and graphing packages simplify scope-based audio-bus debugging 7/31/2009
The serial AudioBus triggering, decoding, and graphing packages for LeCroy Corp’s WaveRunner Xi and WaveSurfer Xs oscilloscopes provide a complete set of tools for precise analysis and debugging of the I2S (inter-IC-sound) bus, a newly developed serial interface for digital-audio applications.Agilent targets bio-analytical measurement with $1.5B Varian buy 7/27/2009
The transaction expands Agilent in industrial and life sciences markets and establishes its entry into nuclear magnetic resonance, imaging, and vacuum technology markets.Design and test combine to speed yield learning 7/8/2009
Verigy has introduced its Yield Learning Solution, which integrates on-tester, real-time capture and analysis of electrical failures on complex SOC (system-on-chip) devices.Adjustment-free units simplify precise probe positioning 7/8/2009
Agilent Technologies’ four new oscilloscope-probe positioners, the N278xA Series, provide quick and stable probe positioning for measurements on PCBs (printed-circuit boards) and other devices that require hands-free probing.Thermal-management software reduces engineering time, speeds product development 7/8/2009
Ansys Inc has announced the latest release of Ansys Icepak software, which applies fluid-dynamics technology to electronics thermal management.Updated USB developer’s guide adds material on 3.0 and Superspeed 6/10/2009
USB Complete: The Developer’s Guide by Jan Axelson, author of many books on embedded-system development, is now in its fourth edition.Software upgrade brings logic-analyzer-style insights to audio testing 6/9/2009
Audio Precision has announced several new features for its APx Series of audio analyzers. These features relate to the display, analysis, and control of metadata in HDMI (high-definition-multimedia interface); IEC (International Electrotechnical Commission) 60598 standard, which defines the Toslink and S/PDIF (Sony/Philips digital-interface format) consumer digital-audio interfaces; and AES3/EBU (Audio Engineering Society 3/European Broadcast Union) digital-audio streams.ADVERTISEMENT
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