<![CDATA[Test & Measurement]]> 4429913 <![CDATA[Electromechanical measurements with an oscilloscope]]> Wed, 16 Apr 2014 04:01 EDT 4429854 <![CDATA[Simplify DC-DC Converter Characterization]]> Sat, 04 Oct 2014 08:17 EDT 4429677 <![CDATA[Automate comparator hysteresis tests]]> Mon, 31 Mar 2014 01:31 EDT 4429661 <![CDATA[Open FPGAs add flexibility to test]]> Thu, 27 Mar 2014 03:05 EDT 4429539 <![CDATA[Vintage test equipment: Not just for old engineers]]> Tue, 25 Mar 2014 05:59 EDT 4429600 <![CDATA[MSOs probe analog and digital]]> Mon, 24 Mar 2014 05:01 EDT 4429592 <![CDATA[Simple capacitance meter bins parts]]> Mon, 24 Mar 2014 08:08 EDT 4429498 <![CDATA[The next generation's modulation: PAM-4, NRZ, or ENRZ?]]> Sun, 16 Mar 2014 09:59 EDT 4429375 <![CDATA[The blurring line between oscilloscopes and On-Die instrumentation]]> Mon, 10 Mar 2014 08:00 EDT 4429312 <![CDATA[Hall-effect sensors measure fields and detect position]]> Thu, 06 Mar 2014 10:40 EST 4429098 <![CDATA[Cross-corner testing finds faults]]> Sat, 01 Mar 2014 10:49 EST 4428607 <![CDATA[AMOLEDs need clear-color testing]]> Thu, 20 Feb 2014 03:11 EST 4428341 <![CDATA[A history of oscilloscope development in Vilnius]]> Fri, 14 Feb 2014 12:07 EST 4428316 <![CDATA[How to select a modular waveform digitizer]]> Thu, 13 Feb 2014 06:20 EST 4428057 <![CDATA[DesignCon paper and tutorial explain de-embedding]]> Mon, 02 Jun 2014 08:30 EDT 4427931 <![CDATA[Measure small impedances with Rogowski current probes]]> Fri, 02 May 2014 07:42 EDT 4427734 <![CDATA[EDN announces 2014 Best in Test Products]]> Thu, 30 Jan 2014 01:51 EST 4427476 <![CDATA[Exercise those storage devices]]> Fri, 24 Jan 2014 12:28 EST 4427293 <![CDATA[Choose your PLL lock-time measurement]]> Tue, 21 Jan 2014 02:35 EST 4427136 <![CDATA[Embedded scanning: The next step in ESD detection]]> Thu, 16 Jan 2014 08:16 EST