Contents
January 10, 2008
Cover Story
- Communications-centric test gear sharpens symbol recognition
Designers pursue next-generation wireless developments with modulation-aware test tools, though evolving standards present problems from the PHY to the data layers.
Design Features
- RFI: keeping noise out of your designs
Noise from cell phones, digital oscillators, and even fluorescent lights is assailing your electronic designs. Learn what causes this noise and what you can do to increase your system's immunity to radio-frequency interference. - Novel measurement circuit eases battery-stack-cell design
A transformer and diode on each cell allows isolated measurement.
Pulse
- Silicon fatigue: not a myth
- IBM millimeter-wave wireless technology inches toward commercialization
- STMicroelectronics claims first 45-nm CMOS-RF chips
- Silicon nanocrystals show promise for solar cells
- National Instruments targets high-volume applications
- Integrated dc/dc regulators improve efficiency in server, embedded-system applications
- Altera MAX IIZ CPLD targets portable applications
- USB-bridge controller supports multilevel-cell NAND flash
- ICs address speedy Ethernet devices’ need for EMI, ESD protection
Departments and Columns
- edn.comment
Open-cellular-network boasts lack substance
- Signal Integrity
Initial condition: The advantage of symmetric end termination in transmission lines
- Scope
Scope: APEC 2008, credit crunch hits tech
- Supply Chain
2007: a less-than-memorable year for DRAM
- Supply Chain
Demand-driven downturn possible in 2008
- Supply Chain
California vetoes ROHS-expansion bill
